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Author(s)Gorelik VS; Karuzskii AL; Sverbil' PP; Cheryvakov AV
TitleLaser-excited volume secondary radiation in wide-gap semiconductors and dielectrics
SourceJOURNAL OF RUSSIAN LASER RESEARCH 23 (5): 459-483
Date2002 SEP-OCT
TypeJournal : Article
LCR2   NCR: 30   LCS: 0   GCS: 1
Comment 
AddressRussian Acad Sci, PN Lebedev Phys Inst, Moscow 119991, Russia.
ReprintGorelik, VS, Russian Acad Sci, PN Lebedev Phys Inst, Leninskii Pr 53,
Moscow 119991, Russia.
AbstractStudies of the volume secondary radiation (photoluminescence and Raman scattering) in wide-pap semiconductors (GaP, ZnSe) and Condensed dielectrics were carried out at various temperatures. Tit(! low-temperature variations of the dielectric. constants were evaluated. The anti-Stokes photoluminescence front the sample bulk resulting from interband and impurity recombination. Was observed for the first time wheil exciting the spectra of, radiation by the continuous radiation of a low-power laser with the lasing line in the transparency region of gallium phosphide. A similar effect was observed at low temperatures in zine selenide excited by an argon laser. Photoluminescence front the sample bulk was also found for a number of condensed dielectrics (Hydrocarbons and oil) at room temperature. The results obtained allow analysis of impurities in the bulk of semiconductors and dielectrics based oil recording the volume photoluminescence spectra.
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