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17 March 2010
Records: 120, Authors: 47, Journals: 35, Cited References: 911, Words: 422
Yearly outputDocument TypeLanguageInstitutionInstitution with SubdivisionCountry
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#Date / Author / JournalLCSGCSLCRCR
2002
101101 van Raan AFJ, van Leeuwen TNRESEARCH POLICY. 2002 MAY; 31 (4): 611-632 217727
2003
102102 van Leeuwen TN, Visser MS, Moed HF, Nederhof TJ, van Raan AFJSCIENTOMETRICS. 2003; 57 (2): 257-280 02629
103103 van Raan AFJ, Visser MS, Van Leeuwen TN, van Wijk EPSYCHOTHERAPY RESEARCH. 2003 WIN; 13 (4): 511-528 02419
104104 van RAAN AFJTECHNIKFOLGENABSCHäTZUNG: THEORIE UND PRAXIS. 2003 MAR; 12 (1): 20-29 01800
2004
105105 Buter RK, Noyons ECM, van Raan AFJEIGHTH INTERNATIONAL CONFERENCE ON INFORMATION VISUALISATION, PROCEEDINGS. 2004; : 978-982 00017
106106 VAN RAAN AFJHANDBOOK OF QUANTITATIVE SCIENCE AND TECHNOLOGY RESEARCH. USE OF PUBLICATION AND PATENT STATISTICS IN STUDIES OF S&T SYSTEMS. 2004; : 19-50 76000
107107 van Raan AFJSCIENTOMETRICS. 2004; 59 (3): 467-472 12913
2005
108108 van Raan AFJMEASUREMENT: INTERDISCIPLINARY RESEARCH AND PERSPECTIVES. 2005; 3 (1): 1-19 2700
109109 van Raan AFJSCIENTOMETRICS. 2005 JAN; 62 (1): 133-143 769628
110110 van Raan AFJSCIENTOMETRICS. 2005 JUN; 63 (3): 549-566 28332
#Date / Author / JournalLCSGCSLCRCR
111111 van Raan AFJSCIENTOMETRICS. 2005 JUL; 64 (1): 111-112 0512
2006
112112 van Raan AFJJOURNAL OF THE AMERICAN SOCIETY FOR INFORMATION SCIENCE AND TECHNOLOGY. 2006 FEB 1; 57 (3): 408-430 619631
113113 van Raan AFJSCIENTOMETRICS. 2006 JUN; 67 (3): 491-502 090414
114114 van Raan AFJJOURNAL OF THE AMERICAN SOCIETY FOR INFORMATION SCIENCE AND TECHNOLOGY. 2006 DEC; 57 (14): 1919-1935 48939
2008
115115 van Raan AFJJOURNAL OF THE AMERICAN SOCIETY FOR INFORMATION SCIENCE AND TECHNOLOGY. 2008 FEB 1; 59 (3): 461-475 18617
116116 van Raan AFJJOURNAL OF THE AMERICAN SOCIETY FOR INFORMATION SCIENCE AND TECHNOLOGY. 2008 FEB 15; 59 (4): 565-576 231138
117117 van Raan AFJJOURNAL OF THE AMERICAN SOCIETY FOR INFORMATION SCIENCE AND TECHNOLOGY. 2008 AUG; 59 (10): 1631-1643 121028
2009
118118 Costas R, van Leeuwen T, van Raan AFJ
Development of a General Methodology for the Analysis of the "Durability" of Scientific Documents
PROCEEDINGS OF ISSI 2009 - 12TH INTERNATIONAL CONFERENCE OF THE INTERNATIONAL SOCIETY FOR SCIENTOMETRICS AND INFORMETRICS, VOL 2. 2009; 2: 918-919
0016
119119 Costas R, Bordons M, van Leeuwen TN, van Raan AFJJOURNAL OF THE AMERICAN SOCIETY FOR INFORMATION SCIENCE AND TECHNOLOGY. 2009 APR; 60 (4): 740-753 00823
120120 Schmoch U, van Raan AFJSCIENTOMETRICS. 2009 AUG; 80 (2): 303-304 0000
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