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17 March 2010
Records: 120, Authors: 47, Journals: 35, Cited References: 911, Words: 422
Yearly outputDocument TypeLanguageInstitutionInstitution with SubdivisionCountry
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#Date / Author / JournalLCSGCSLCRCR
10181 Noyons ECM, Moed HF, van Raan AFJSCIENTOMETRICS. 1999 NOV-DEC; 46 (3): 591-604 05212
10285 van Raan AFJ
R&D evaluation at the beginning of the new century
RESEARCH EVALUATION. 2000 AUG; 9 (2): 81-86
06210
10387 Rinia EJ, Van Leeuwen TN, Van Vuren HG, van Raan AFJ8TH INTERNATIONAL CONFERENCE ON SCIENTOMETRICS AND INFORMETRICS, VOLS 1 AND 2 - ISSI-2001, PROCEEDINGS. 2001; : 10-11 0000
10488 Rinia EJ, van Leeuwen TN, Bruins EEW, van Vuren HG, van Raan AFJ8TH INTERNATIONAL CONFERENCE ON SCIENTOMETRICS AND INFORMETRICS, VOLS 1 AND 2 - ISSI-2001, PROCEEDINGS. 2001; : 597-605 00211
10589 Rinia EJ, van Leeuwen TN, Bruins EEW, van Vuren HG, van Raan AFJ8TH INTERNATIONAL CONFERENCE ON SCIENTOMETRICS AND INFORMETRICS, VOLS 1 AND 2 - ISSI-2001, PROCEEDINGS. 2001; : 597-605 00211
10690 van Raan AFJSCIENTOMETRICS. 2001 JAN; 50 (1): 59-63 022310
10796 van Leeuwen TN, van der Wurff LJ, van Raan AFJRESEARCH EVALUATION. 2001 DEC; 10 (3): 195-201 01013
10897 Rinia EJ, van Leeuwen TN, Bruins EEW, van Vuren HG, van Raan AFJSCIENTOMETRICS. 2002; 54 (3): 347-362 018217
10998 Noyons ECM, Buter RK, van Raan AFJSIXTH INTERNATIONAL CONFERENCE ON INFORMATION VISUALISATION, PROCEEDINGS. 2002; : 679-684 0016
11099 Noyons ECM, Buter RK, van Raan AFJSIXTH INTERNATIONAL CONFERENCE ON INFORMATION VISUALISATION, PROCEEDINGS. 2002; : 679-684 0016
#Date / Author / JournalLCSGCSLCRCR
111100 Rinia EJ, Van Leeuwen TN, van Raan AFJSCIENTOMETRICS. 2002 FEB; 53 (2): 241-248 0426
112102 van Leeuwen TN, Visser MS, Moed HF, Nederhof TJ, van Raan AFJSCIENTOMETRICS. 2003; 57 (2): 257-280 02629
113103 van Raan AFJ, Visser MS, Van Leeuwen TN, van Wijk EPSYCHOTHERAPY RESEARCH. 2003 WIN; 13 (4): 511-528 02419
114104 van RAAN AFJTECHNIKFOLGENABSCHäTZUNG: THEORIE UND PRAXIS. 2003 MAR; 12 (1): 20-29 01800
115105 Buter RK, Noyons ECM, van Raan AFJEIGHTH INTERNATIONAL CONFERENCE ON INFORMATION VISUALISATION, PROCEEDINGS. 2004; : 978-982 00017
116111 van Raan AFJSCIENTOMETRICS. 2005 JUL; 64 (1): 111-112 0512
117113 van Raan AFJSCIENTOMETRICS. 2006 JUN; 67 (3): 491-502 090414
118118 Costas R, van Leeuwen T, van Raan AFJ
Development of a General Methodology for the Analysis of the "Durability" of Scientific Documents
PROCEEDINGS OF ISSI 2009 - 12TH INTERNATIONAL CONFERENCE OF THE INTERNATIONAL SOCIETY FOR SCIENTOMETRICS AND INFORMETRICS, VOL 2. 2009; 2: 918-919
0016
119119 Costas R, Bordons M, van Leeuwen TN, van Raan AFJJOURNAL OF THE AMERICAN SOCIETY FOR INFORMATION SCIENCE AND TECHNOLOGY. 2009 APR; 60 (4): 740-753 00823
120120 Schmoch U, van Raan AFJSCIENTOMETRICS. 2009 AUG; 80 (2): 303-304 0000
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