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101 | 1487 Glanzel WSCIENTOMETRICS. 2000 JUN; 48 (2): 121-150
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102 | 1822 Heimeriks G, Horlesberger M, Van den Besselaar PSCIENTOMETRICS. 2003 OCT; 58 (2): 391-413
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103 | 1103 Moed HF, vanLeeuwen TN, Reedijk JSCIENTOMETRICS. 1996 SEP; 37 (1): 105-116
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105 | 74 PRICE DDSCIENTOMETRICS. 1981; 3 (1): 55-63
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106 | 212 DIAMOND AMSCIENTOMETRICS. 1984; 6 (3): 189-196
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107 | 376 LEYDESDORFF LSCIENTOMETRICS. 1987 MAY; 11 (5-6): 295-324
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108 | 432 BRAUN T, GLANZEL W, SCHUBERT ASCIENTOMETRICS. 1988 MAY; 13 (5-6): 181-188
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109 | 1183 Vinkler PSCIENTOMETRICS. 1997 SEP; 40 (1): 163-169
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110 | 1757 Thelwall M, Tang R, Price LSCIENTOMETRICS. 2003; 56 (3): 417-432
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111 | 1871 Leydesdorff LSCIENTOMETRICS. 2004; 60 (2): 159-180
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112 | 2103 Liang LMSCIENTOMETRICS. 2006 APR; 69 (1): 153-159
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113 | 877 GLANZEL W, SCHOEPFLIN USCIENTOMETRICS. 1994 MAY; 30 (1): 49-64
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114 | 1008 BRAUN T, GLANZEL W, GRUPP HSCIENTOMETRICS. 1995 OCT; 34 (2): 207-237
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115 | 1138 Schmoch USCIENTOMETRICS. 1997 JAN; 38 (1): 103-116
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116 | 1666 Prpic KSCIENTOMETRICS. 2002; 55 (1): 27-58
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118 | 1976 Zitt M, Ramanana-Rahary S, Bassecoulard ESCIENTOMETRICS. 2005 APR; 63 (2): 373-401
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119 | 182 PERITZ BCSCIENTOMETRICS. 1983; 5 (5): 303-312
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120 | 272 VLACHY JSCIENTOMETRICS. 1985; 7 (3-6): 505-528
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121 | 436 VINKLER PSCIENTOMETRICS. 1988 MAY; 13 (5-6): 239-259
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122 | 1044 Glanzel WSCIENTOMETRICS. 1996 FEB; 35 (2): 167-176
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123 | 1057 Glanzel WSCIENTOMETRICS. 1996 MAR-APR; 35 (3): 291-307
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124 | 1116 Bordons M, Gomez I, Fernandez MT, Zulueta MA, Mendez ASCIENTOMETRICS. 1996 OCT; 37 (2): 279-295
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125 | 1343 Glanzel W, Schubert A, Czerwon HJSCIENTOMETRICS. 1999 JUN; 45 (2): 185-202
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126 | 1488 Meyer MSCIENTOMETRICS. 2000 JUN; 48 (2): 151-178
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127 | 1760 Gmur MSCIENTOMETRICS. 2003; 57 (1): 27-57
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128 | 763 EGGHE L, RAO IKRSCIENTOMETRICS. 1992 SEP; 25 (1): 5-46
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129 | 897 ZITT M, BASSECOULARD ESCIENTOMETRICS. 1994 MAY; 30 (1): 333-351
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130 | 1324 Glanzel W, Schubert A, Czerwon HJSCIENTOMETRICS. 1999 MAR-APR; 44 (3): 427-439
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131 | 1708 Ren SL, Rousseau RSCIENTOMETRICS. 2002 MAR-APR; 53 (3): 389-405
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132 | 1850 Bar-Ilan JSCIENTOMETRICS. 2004; 59 (3): 391-403
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133 | 127 NOMA ESCIENTOMETRICS. 1982; 4 (4): 297-316
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134 | 407 ZUCKERMAN HSCIENTOMETRICS. 1987 NOV; 12 (5-6): 329-338
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135 | 801 VANRAAN AFJ, TIJSSEN RJWSCIENTOMETRICS. 1993 JAN; 26 (1): 169-192
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136 | 1462 van Raan AFJSCIENTOMETRICS. 2000 FEB; 47 (2): 347-362
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137 | 1547 Persson OSCIENTOMETRICS. 2001 FEB; 50 (2): 339-344
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138 | 2183 Small HSCIENTOMETRICS. 2006 DEC; 68 (3): 595-610
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139 | 264 AVERSA ESSCIENTOMETRICS. 1985; 7 (3-6): 383-389
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140 | 671 BURRELL QLSCIENTOMETRICS. 1991 JUN; 21 (2): 181-194
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141 | 1143 VanRaan AFJSCIENTOMETRICS. 1997 JAN; 38 (1): 205-218
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142 | 1557 van Dalen HP, Henkens KSCIENTOMETRICS. 2001 MAR-APR; 50 (3): 455-482
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143 | 2167 Archambault E, Vignola-Gagne E, Cote G, Lariviere V, Gingras YSCIENTOMETRICS. 2006 DEC; 68 (3): 329-342
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144 | 735 LAW J, WHITTAKER JSCIENTOMETRICS. 1992 MAR-APR; 23 (3): 417-461
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146 | 946 COURTIAL JPSCIENTOMETRICS. 1994 NOV-DEC; 31 (3): 251-260
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148 | 1276 Garfield ESCIENTOMETRICS. 1998 SEP; 43 (1): 69-76
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149 | 1281 Van Raan AFJSCIENTOMETRICS. 1998 SEP; 43 (1): 129-139
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150 | 1647 Meyer MSCIENTOMETRICS. 2002; 54 (2): 193-212
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151 | 1673 Glanzel W, Schubert A, Braun TSCIENTOMETRICS. 2002; 55 (3): 335-348
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152 | 1873 Sombatsompop N, Markpin T, Premkamolnetr NSCIENTOMETRICS. 2004; 60 (2): 217-235
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153 | 678 MOED HF, DEBRUIN RE, NEDERHOF AJ, TIJSSEN RJWSCIENTOMETRICS. 1991 JUL-AUG; 21 (3): 291-311
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155 | 2063 Butler L, Visser MSSCIENTOMETRICS. 2006 JAN; 66 (2): 327-343
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156 | 2212 Schubert ASCIENTOMETRICS. 2007 JAN; 70 (1): 201-205
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157 | 2300 Fowler JH, Aksnes DWSCIENTOMETRICS. 2007 SEP; 72 (3): 427-437
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158 | 2307 Burrell QLSCIENTOMETRICS. 2007 OCT; 73 (1): 19-28
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159 | 2325 Iglesias JE, Pecharroman CSCIENTOMETRICS. 2007 DEC; 73 (3): 303-320
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160 | 2348 Kousha K, Thelwall MSCIENTOMETRICS. 2008 FEB; 74 (2): 273-294
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161 | 383 VINKLER PSCIENTOMETRICS. 1987 JUL; 12 (1-2): 47-72
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162 | 536 MCCAIN KW, TURNER KSCIENTOMETRICS. 1989 JUL; 17 (1-2): 127-163
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163 | 791 SMALL HSCIENTOMETRICS. 1993 JAN; 26 (1): 5-20
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164 | 868 MIQUEL JF, OKUBO YSCIENTOMETRICS. 1994 FEB; 29 (2): 271-297
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165 | 1178 Rousseau S, Rousseau RSCIENTOMETRICS. 1997 SEP; 40 (1): 45-56
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166 | 1211 Glanzel W, De Lange CSCIENTOMETRICS. 1997 NOV-DEC; 40 (3): 605-626
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167 | 1351 Jin BH, Wang BSCIENTOMETRICS. 1999 JUN; 45 (2): 325-332
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168 | 1461 Moed HFSCIENTOMETRICS. 2000 FEB; 47 (2): 323-346
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170 | 1746 Zitt M, Ramanana-Rahary S, Bassecoulard ESCIENTOMETRICS. 2003; 56 (2): 259-282
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171 | 1802 Glanzel W, Schlemmer B, Thijs BSCIENTOMETRICS. 2003; 58 (3): 571-586
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172 | 1803 Hood WW, Wilson CSSCIENTOMETRICS. 2003; 58 (3): 587-608
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175 | 346 SMART JC, BAYER AESCIENTOMETRICS. 1986 NOV; 10 (5-6): 297-305
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179 | 874 ARUNACHALAM S, SRINIVASAN R, RAMAN VSCIENTOMETRICS. 1994 MAY; 30 (1): 7-22
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180 | 977 HERBERTZ HSCIENTOMETRICS. 1995 MAY; 33 (1): 117-122
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181 | 1216 Narin F, Olivastro DSCIENTOMETRICS. 1998 JAN-FEB; 41 (1-2): 51-59
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182 | 1571 Mabe M, Amin MSCIENTOMETRICS. 2001 MAY; 51 (1): 147-162
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191 | 1659 Tijssen RJW, Visser MS, van Leeuwen TNSCIENTOMETRICS. 2002; 54 (3): 381-397
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199 | 513 AMSTERDAMSKA O, LEYDESDORFF LSCIENTOMETRICS. 1989 MAY; 15 (5-6): 449-471
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200 | 1027 Narin FSCIENTOMETRICS. 1995 NOV-DEC; 34 (3): 489-496
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