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301 | 2802 Lim H, Park YSCIENTOMETRICS. 2010 SEP; 84 (3): 543-561
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302 | 2875 Lee PC, Su HN, Chan TYSCIENTOMETRICS. 2010 DEC; 85 (3): 689-703
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307 | 2997 Costas R, Bordons MSCIENTOMETRICS. 2011 JUL; 88 (1): 145-161
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320 | 2662 Hung SW, Wang APSCIENTOMETRICS. 2010 JAN; 82 (1): 121-134
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321 | 2761 Borner K, Huang WX, Linnemeier M, Duhon RJ, Phillips P, et al.SCIENTOMETRICS. 2010 JUN; 83 (3): 863-876
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330 | 1787 Eto HSCIENTOMETRICS. 2003; 58 (1): 5-33
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331 | 2067 Bonaccorsi A, Daraio C, Simar LSCIENTOMETRICS. 2006 JAN; 66 (2): 389-410
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332 | 2071 Ackermann ESCIENTOMETRICS. 2006 FEB; 66 (3): 451-466
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361 | 2017 Park HW, Hong HD, Leydesdorff LSCIENTOMETRICS. 2005 OCT; 65 (1): 3-27
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362 | 2173 Bornmann L, Daniel HDSCIENTOMETRICS. 2006 DEC; 68 (3): 427-440
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370 | 271 GARFIELD ESCIENTOMETRICS. 1985; 7 (3-6): 487-503
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371 | 449 KIDD JSSCIENTOMETRICS. 1988 JUL; 14 (1-2): 127-142
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380 | 1775 Laudel GSCIENTOMETRICS. 2003; 57 (2): 215-237
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