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13 March 2010
Records: 651, Authors: 1148, Journals: 2, Cited References: 57834, Words: 1176
Yearly output | Document Type | Language | Institution | Institution with Subdivision | Country
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#Date / Author / JournalLCSGCSLCRCR
601428 Weiner S, Wagner HD
The material bone: Structure mechanical function relations
ANNUAL REVIEW OF MATERIALS SCIENCE. 1998; 28: 271-298 		1485094
602429 Norton DP
Science and technology of high-temperature superconducting films
ANNUAL REVIEW OF MATERIALS SCIENCE. 1998; 28: 299-347 		0240174
603430 Parise JB, Weidner DJ, Chen J, Liebermann RC, Chen G
In situ studies of the properties of materials under high-pressure and temperature conditions using multi-anvil apparatus and synchrotron X-rays
ANNUAL REVIEW OF MATERIALS SCIENCE. 1998; 28: 349-374 		0190130
604431 Auciello O, Krauss AR, Im J, Schultz JA
Studies of multicomponent oxide films and layered heterostructure growth processes via in situ, time-of-flight ion scattering and direct recoil spectroscopy
ANNUAL REVIEW OF MATERIALS SCIENCE. 1998; 28: 375-396 		019051
605432 Dimos D, Mueller CH
Perovskite thin films for high-frequency capacitor applications
ANNUAL REVIEW OF MATERIALS SCIENCE. 1998; 28: 397-419 		070066
606433 MacManus-Driscoll JL
Recent developments in conductor processing of high irreversibility field superconductors
ANNUAL REVIEW OF MATERIALS SCIENCE. 1998; 28: 421-462 		0480136
607434 Aggarwal S, Ramesh R
Point defect chemistry of metal oxide heterostructures
ANNUAL REVIEW OF MATERIALS SCIENCE. 1998; 28: 463-499 		0381113
608435 Auciello O, Foster CM, Ramesh R
Processing technologies for ferroelectric thin films and heterostructures
ANNUAL REVIEW OF MATERIALS SCIENCE. 1998; 28: 501-531 		144071
609436 Cheng SZD, Keller A
The role of metastable states in polymer phase transitions: Concepts, principles, and experimental observations
ANNUAL REVIEW OF MATERIALS SCIENCE. 1998; 28: 533-562 		056094
610437 Polla DL, Francis LF
Processing and characterization of piezoelectric materials and integration into microelectromechanical systems
ANNUAL REVIEW OF MATERIALS SCIENCE. 1998; 28: 563-597 		21471108
#Date / Author / JournalLCSGCSLCRCR
611438 Meador MA
Recent advances in the development of processable high-temperature polymers
ANNUAL REVIEW OF MATERIALS SCIENCE. 1998; 28: 599-630 		0450116
612439 Badding JV
High-pressure synthesis, characterization, and tuning of solid state materials
ANNUAL REVIEW OF MATERIALS SCIENCE. 1998; 28: 631-658 		0490105
613440 Flemings MC
What next for departments of materials science and engineering?
ANNUAL REVIEW OF MATERIALS SCIENCE. 1999; 29: 1-23 		08013
614441 Ice GE, Sparks CJ
Modern resonant X-ray studies of alloys: Local order and displacements
ANNUAL REVIEW OF MATERIALS SCIENCE. 1999; 29: 25-52 		118060
615442 Hartmann U
Magnetic force microscopy
ANNUAL REVIEW OF MATERIALS SCIENCE. 1999; 29: 53-87 		071020
616443 Nolas GS, Morelli DT, Tritt TM
Skutterudites: A phonon-glass-electron crystal approach to advanced thermoelectric energy conversion applications
ANNUAL REVIEW OF MATERIALS SCIENCE. 1999; 29: 89-116 		0188071
617444 Kirtley JR, Wikswo JP
Scanning squid microscopy
ANNUAL REVIEW OF MATERIALS SCIENCE. 1999; 29: 117-148 		042098
618445 Xiang XD
Combinatorial materials synthesis and screening: An integrated materials chip approach to discovery and optimization of functional materials
ANNUAL REVIEW OF MATERIALS SCIENCE. 1999; 29: 149-+ 		260040
619446 Gao HJ, Nix WD
Surface roughening of heteroepitaxial thin films
ANNUAL REVIEW OF MATERIALS SCIENCE. 1999; 29: 173-209 		0109064
620447 Gruen DM
Nanocrystalline diamond films
ANNUAL REVIEW OF MATERIALS SCIENCE. 1999; 29: 211-259 		04300126
#Date / Author / JournalLCSGCSLCRCR
621448 Goodson KE, Ju YS
Heat conduction in novel electronic films
ANNUAL REVIEW OF MATERIALS SCIENCE. 1999; 29: 261-293 		0750109
622449 Suslick KS, Price GJ
Applications of ultrasound to materials chemistry
ANNUAL REVIEW OF MATERIALS SCIENCE. 1999; 29: 295-326 		03870143
623450 Van der Biest OO, Vandeperre LJ
Electrophoretic deposition of materials
ANNUAL REVIEW OF MATERIALS SCIENCE. 1999; 29: 327-352 		02110113
624451 Fujihira M
Kelvin probe force microscopy of molecular surfaces
ANNUAL REVIEW OF MATERIALS SCIENCE. 1999; 29: 353-380 		071190
625452 Moodera JS, Nassar J, Mathon G
Spin-tunneling in ferromagnetic junctions
ANNUAL REVIEW OF MATERIALS SCIENCE. 1999; 29: 381-432 		01580143
626453 Barbara PF, Adams DM, O'Connor DB
Characterization of organic thin film materials with near-field scanning optical microscopy (NSOM)
ANNUAL REVIEW OF MATERIALS SCIENCE. 1999; 29: 433-+ 		0420107
627454 Williams CC
Two-dimensional dopant profiling by scanning capacitance microscopy
ANNUAL REVIEW OF MATERIALS SCIENCE. 1999; 29: 471-504 		094050
628455 Majumdar A
Scanning thermal microscopy
ANNUAL REVIEW OF MATERIALS SCIENCE. 1999; 29: 505-585 		1142068
629456 Rosenberg R, Murray CB
From materials to devices: Scaling and integration
ANNUAL REVIEW OF MATERIALS SCIENCE. 2000; 30: XII-XV 		0000
630457 Kaufmann EN, Editorial Comm
Preface
ANNUAL REVIEW OF MATERIALS SCIENCE. 2000; 30: V-VI 		0000
#Date / Author / JournalLCSGCSLCRCR
631458 Cohen ML
The theory of real materials
ANNUAL REVIEW OF MATERIALS SCIENCE. 2000; 30: 1-26 		021064
632459 Muratov VA, Fischer TE
Tribochemical polishing
ANNUAL REVIEW OF MATERIALS SCIENCE. 2000; 30: 27-51 		08188
633460 Yamanaka S
High-T-c superconductivity in electron-doped layer structured nitrides
ANNUAL REVIEW OF MATERIALS SCIENCE. 2000; 30: 53-82 		039095
634461 Bunning TJ, Natarajan LV, Tondiglia VP, Sutherland RL
Holographic polymer-dispersed liquid crystals (H-PDLCs)
ANNUAL REVIEW OF MATERIALS SCIENCE. 2000; 30: 83-115 		0234061
635462 Rogers JA, Maznev AA, Banet MJ, Nelson KA
Optical generation and characterization of acoustic waves in thin films: Fundamentals and applications
ANNUAL REVIEW OF MATERIALS SCIENCE. 2000; 30: 117-157 		076157
636463 Thompson CV
Structure evolution during processing of polycrystalline films
ANNUAL REVIEW OF MATERIALS SCIENCE. 2000; 30: 159-190 		01923108
637464 Gibson LJ
Mechanical behavior of metallic foams
ANNUAL REVIEW OF MATERIALS SCIENCE. 2000; 30: 191-227 		078074
638465 Rosenberg R, Edelstein DC, Hu CK, Rodbell KP
Copper metallization for high performance silicon technology
ANNUAL REVIEW OF MATERIALS SCIENCE. 2000; 30: 229-262 		1167038
639466 Shaw TM, Trolier-McKinstry S, McIntyre PC
The properties of ferroelectric films at small dimensions
ANNUAL REVIEW OF MATERIALS SCIENCE. 2000; 30: 263-298 		31830169
640467 Sniegowski JJ, de Boer MP
IC-compatible polysilicon surface micromachining
ANNUAL REVIEW OF MATERIALS SCIENCE. 2000; 30: 299-333 		01000104
#Date / Author / JournalLCSGCSLCRCR
641468 Mooney PM, Chu JO
SiGe technology: Heteroepitaxy and high-speed microelectronics
ANNUAL REVIEW OF MATERIALS SCIENCE. 2000; 30: 335-362 		036185
642469 Kaloyeros AE, Eisenbraun E
Ultrathin diffusion barriers/liners for gigascale copper metallization
ANNUAL REVIEW OF MATERIALS SCIENCE. 2000; 30: 363-385 		0149086
643470 Gschneidner KA, Pecharsky VK
Magnetocaloric materials
ANNUAL REVIEW OF MATERIALS SCIENCE. 2000; 30: 387-429 		01970143
644471 Tromp RM, Ross FM
Advances in situ ultra-high vacuum electron microscopy: Growth of SiGe on Si
ANNUAL REVIEW OF MATERIALS SCIENCE. 2000; 30: 431-449 		213056
645472 Kimura T, Tokura Y
Layered magnetic manganites
ANNUAL REVIEW OF MATERIALS SCIENCE. 2000; 30: 451-474 		083063
646473 Efros AL, Rosen M
The electronic structure of semiconductor nanocrystals
ANNUAL REVIEW OF MATERIALS SCIENCE. 2000; 30: 475-521 		0264064
647474 Harper JME, Cabral C, Lavoie C
Mechanisms for enhanced formation of the C54 phase of titanium silicide ultra-large-scale integration contacts
ANNUAL REVIEW OF MATERIALS SCIENCE. 2000; 30: 523-543 		023052
648475 Murray CB, Kagan CR, Bawendi MG
Synthesis and characterization of monodisperse nanocrystals and close-packed nanocrystal assemblies
ANNUAL REVIEW OF MATERIALS SCIENCE. 2000; 30: 545-610 		112701193
649476 Weller D, Doerner MF
Extremely high-density longitudinal magnetic recording media
ANNUAL REVIEW OF MATERIALS SCIENCE. 2000; 30: 611-644 		11230149
650477 Morgen M, Ryan ET, Zhao JH, Hu C, Cho TH, et al.
Low dielectric constant materials for ULSI interconnects
ANNUAL REVIEW OF MATERIALS SCIENCE. 2000; 30: 645-680 		02020111
#Date / Author / JournalLCSGCSLCRCR
651478 Solomon PM
Device innovation and material challenges at the limits of CMOS technology
ANNUAL REVIEW OF MATERIALS SCIENCE. 2000; 30: 681-697 		17036
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