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13 March 2010
Records: 651, Authors: 1148, Journals: 2, Cited References: 57834, Words: 1176
Yearly output | Document Type | Language | Institution | Institution with Subdivision | Country
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#Date / Author / JournalLCSGCSLCRCR
601599 Kimura T
Spiral magnets as magnetoelectrics
ANNUAL REVIEW OF MATERIALS RESEARCH. 2007; 37: 387-413 		041083
602600 Kleemann W
Universal domain wall dynamics in disordered ferroic materials
ANNUAL REVIEW OF MATERIALS RESEARCH. 2007; 37: 415-448 		011064
603601 Gopalan V, Dierolf V, Scrymgeour DA
Defect-domain wall interactions in trigonal ferroelectrics
ANNUAL REVIEW OF MATERIALS RESEARCH. 2007; 37: 449-489 		0160122
604602 Schneider GA
Influence of electric field and mechanical stresses on the fracture of ferroelectrics
ANNUAL REVIEW OF MATERIALS RESEARCH. 2007; 37: 491-538 		09097
605603 Lichte H, Formanek P, Lenk A, Linck M, Matzeck C, et al.
Electron holography: Applications to materials questions
ANNUAL REVIEW OF MATERIALS RESEARCH. 2007; 37: 539-588 		09055
606604 Schlom DG, Chen LQ, Eom CB, Rabe KM, Streiffer SK, et al.
Strain tuning of ferroelectric thin films
ANNUAL REVIEW OF MATERIALS RESEARCH. 2007; 37: 589-626 		0493159
607605 Rollett AD, Lee SB, Campman R, Rohrer GS
Three-dimensional characterization of microstructure by electron back-scatter diffraction
ANNUAL REVIEW OF MATERIALS RESEARCH. 2007; 37: 627-658 		09081
608606 Wessels BW
Ferroelectric epitaxial thin films for integrated optics
ANNUAL REVIEW OF MATERIALS RESEARCH. 2007; 37: 659-679 		09146
609607 Kelly TF, Larson DJ, Thompson K, Alvis RL, Bunton JH, et al.
Atom probe tomography of electronic materials
ANNUAL REVIEW OF MATERIALS RESEARCH. 2007; 37: 681-727 		0262117
610608 McCartney MR, Smith DJ
Electron holography: Phase imaging with nanometer resolution
ANNUAL REVIEW OF MATERIALS RESEARCH. 2007; 37: 729-767 		0130128
#Date / Author / JournalLCSGCSLCRCR
611609 De Coninck J, Blake TD
Wetting and molecular dynamics simulations of simple liquids
ANNUAL REVIEW OF MATERIALS RESEARCH. 2008; 38: 1-22 		06061
612610 Ralston J, Popescu M, Sedev R
Dynamics of wetting from an experimental point of view
ANNUAL REVIEW OF MATERIALS RESEARCH. 2008; 38: 23-43 		0120102
613613 Herminghaus S, Brinkmann M, Seemann R
Wetting and dewetting of complex surface geometries
ANNUAL REVIEW OF MATERIALS RESEARCH. 2008; 38: 101-121 		04168
614614 Binder K
Modeling of wetting in restricted geometries
ANNUAL REVIEW OF MATERIALS RESEARCH. 2008; 38: 123-142 		06023
615615 Rauscher M, Dietrich S
Wetting phenomena in nanofluidics
ANNUAL REVIEW OF MATERIALS RESEARCH. 2008; 38: 143-172 		090270
616616 Wynblatt P
Interfacial segregation effects in wetting phenomena
ANNUAL REVIEW OF MATERIALS RESEARCH. 2008; 38: 173-196 		01154
617617 Saiz E, Cannon RM, Tomsia AP
High-temperature wetting and the work of adhesion in metal/oxide systems
ANNUAL REVIEW OF MATERIALS RESEARCH. 2008; 38: 197-226 		021162
618618 Luo J, Chiang YM
Wetting and prewetting on ceramic surfaces
ANNUAL REVIEW OF MATERIALS RESEARCH. 2008; 38: 227-249 		012079
619619 Matsumoto T, Nogi K
Wetting in soldering and microelectronics
ANNUAL REVIEW OF MATERIALS RESEARCH. 2008; 38: 251-273 		00042
620620 Hou PY
Segregation phenomena at thermally grown Al2O3/alloy interfaces
ANNUAL REVIEW OF MATERIALS RESEARCH. 2008; 38: 275-298 		0100104
#Date / Author / JournalLCSGCSLCRCR
621621 Rajan K
Combinatorial materials sciences: Experimental strategies for accelerated knowledge discovery
ANNUAL REVIEW OF MATERIALS RESEARCH. 2008; 38: 299-322 		04285
622622 Wegst UGK
Bamboo and wood in musical instruments
ANNUAL REVIEW OF MATERIALS RESEARCH. 2008; 38: 323-349 		00060
623623 Li DB, Bonnell DA
Controlled patterning of ferroelectric domains: Fundamental concepts and applications
ANNUAL REVIEW OF MATERIALS RESEARCH. 2008; 38: 351-368 		06077
624624 Davies PK, Wu H, Borisevich AY, Molodetsky IE, Farber L
Crystal chemistry of complex perovskites: New cation-ordered dielectric oxides
ANNUAL REVIEW OF MATERIALS RESEARCH. 2008; 38: 369-401 		04096
625625 Louzguine-Luzgin DV, Inoue A
Formation and properties of quasicrystals
ANNUAL REVIEW OF MATERIALS RESEARCH. 2008; 38: 403-423 		010147
626626 Marshall DB, Cox BN
Integral textile ceramic structures
ANNUAL REVIEW OF MATERIALS RESEARCH. 2008; 38: 425-443 		02032
627627 Chen MW
Mechanical behavior of metallic glasses: Microscopic understanding of strength and ductility
ANNUAL REVIEW OF MATERIALS RESEARCH. 2008; 38: 445-469 		0210123
628628 Odette GR, Alinger MJ, Wirth BD
Recent developments in irradiation-resistant steels
ANNUAL REVIEW OF MATERIALS RESEARCH. 2008; 38: 471-503 		0150147
629629 Bamberger M, Dehm G
Trends in the development of new Mg alloys
ANNUAL REVIEW OF MATERIALS RESEARCH. 2008; 38: 505-533 		04041
630630 Rez P, Muller DA
The theory and interpretation of electron energy loss near-edge fine structure
ANNUAL REVIEW OF MATERIALS RESEARCH. 2008; 38: 535-558 		05072
#Date / Author / JournalLCSGCSLCRCR
631631 Petford-Long AK, Chiaramonti AN
Transmission electron microscopy of multilayer thin films
ANNUAL REVIEW OF MATERIALS RESEARCH. 2008; 38: 559-584 		013130
632632 Clarke DR, Ruhle M
materials Advances for Next-Generation Microelectronics - Introduction
ANNUAL REVIEW OF MATERIALS RESEARCH. 2009; 39: V-VII 		0000
633633 Heath JR
Molecular Electronics
ANNUAL REVIEW OF MATERIALS RESEARCH. 2009; 39: 1-23 		010114
634634 Raoux S
Phase Change Materials
ANNUAL REVIEW OF MATERIALS RESEARCH. 2009; 39: 25-48 		020121
635635 Grill A
Porous pSiCOH Ultralow-k Dielectrics for Chip Interconnects Prepared by PECVD
ANNUAL REVIEW OF MATERIALS RESEARCH. 2009; 39: 49-69 		05056
636636 Katz HE, Huang J
Thin-Film Organic Electronic Devices
ANNUAL REVIEW OF MATERIALS RESEARCH. 2009; 39: 71-92 		000172
637637 French RH, Tran HV
Immersion Lithography: Photomask and Wafer-Level Materials
ANNUAL REVIEW OF MATERIALS RESEARCH. 2009; 39: 93-126 		0210129
638638 Sewell H, Mulkens J
Materials for Optical Lithography Tool Application
ANNUAL REVIEW OF MATERIALS RESEARCH. 2009; 39: 127-153 		00078
639639 Costner EA, Lin MW, Jen WL, Willson CG
Nanoimprint Lithography Materials Development for Semiconductor Device Fabrication
ANNUAL REVIEW OF MATERIALS RESEARCH. 2009; 39: 155-180 		001113
640640 Guha S, Narayanan V
High-kappa/Metal Gate Science and Technology
ANNUAL REVIEW OF MATERIALS RESEARCH. 2009; 39: 181-202 		00082
#Date / Author / JournalLCSGCSLCRCR
641641 Chu M, Sun YK, Aghoram U, Thompson SE
Strain: A Solution for Higher Carrier Mobility in Nanoscale MOSFETs
ANNUAL REVIEW OF MATERIALS RESEARCH. 2009; 39: 203-229 		000122
642642 Josell D, Brongersma SH, Tokei Z
Size-Dependent Resistivity in Nanoscale Interconnects
ANNUAL REVIEW OF MATERIALS RESEARCH. 2009; 39: 231-254 		01088
643643 Naeemi A, Meindl JD
Carbon Nanotube Interconnects
ANNUAL REVIEW OF MATERIALS RESEARCH. 2009; 39: 255-275 		00046
644644 Slaughter JM
Materials for Magnetoresistive Random Access Memory
ANNUAL REVIEW OF MATERIALS RESEARCH. 2009; 39: 277-296 		00067
645645 Muratore C, Voevodin AA
Chameleon Coatings: Adaptive Surfaces to Reduce Friction and Wear in Extreme Environments
ANNUAL REVIEW OF MATERIALS RESEARCH. 2009; 39: 297-324 		000151
646646 Chambers MD, Clarke DR
Doped Oxides for High-Temperature Luminescence and Lifetime Thermometry
ANNUAL REVIEW OF MATERIALS RESEARCH. 2009; 39: 325-359 		000165
647647 Uchic MD, Shade PA, Dimiduk DM
Plasticity of Micrometer-Scale Single Crystals in Compression
ANNUAL REVIEW OF MATERIALS RESEARCH. 2009; 39: 361-386 		04085
648648 Tenne R, Seifert G
Recent Progress in the Study of Inorganic Nanotubes and Fullerene-Like Structures
ANNUAL REVIEW OF MATERIALS RESEARCH. 2009; 39: 387-413 		000111
649649 Wang JY, Zhou YC
Recent Progress in Theoretical Prediction, Preparation, and Characterization of Layered Ternary Transition-Metal Carbides
ANNUAL REVIEW OF MATERIALS RESEARCH. 2009; 39: 415-443 		00095
650650 Mather PT, Luo XF, Rousseau IA
Shape Memory Polymer Research
ANNUAL REVIEW OF MATERIALS RESEARCH. 2009; 39: 445-471 		01092
#Date / Author / JournalLCSGCSLCRCR
651651 Marmur A
Solid-Surface Characterization by Wetting
ANNUAL REVIEW OF MATERIALS RESEARCH. 2009; 39: 473-489 		02161
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