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13 March 2010
Records: 651, Authors: 1148, Journals: 2, Cited References: 57834, Words: 1176
Yearly output | Document Type | Language | Institution | Institution with Subdivision | Country
Page 5 of 7: [  1  2  3  4  5  6  7 ]
#Date / Author / JournalLCSGCSLCRCR
401356 RUOFF AL, LI T
PHASE-TRANSITIONS IN III-V COMPOUNDS TO MEGABAR PRESSURES
ANNUAL REVIEW OF MATERIALS SCIENCE. 1995; 25: 249-271 		0190146
402357 DIMOS D
FERROELECTRIC THIN-FILMS FOR PHOTONICS - PROPERTIES AND APPLICATIONS
ANNUAL REVIEW OF MATERIALS SCIENCE. 1995; 25: 273-293 		030066
403358 CRIST B
THE ULTIMATE STRENGTH AND STIFFNESS OF POLYMERS
ANNUAL REVIEW OF MATERIALS SCIENCE. 1995; 25: 295-323 		0280110
404359 STAMM M, SCHUBERT DW
INTERFACES BETWEEN INCOMPATIBLE POLYMERS
ANNUAL REVIEW OF MATERIALS SCIENCE. 1995; 25: 325-356 		0871101
405361 PALMSTROM CJ
EPITAXY OF DISSIMILAR MATERIALS
ANNUAL REVIEW OF MATERIALS SCIENCE. 1995; 25: 389-415 		0220158
406362 FITZGERALD EA
GESI/SI NANOSTRUCTURES
ANNUAL REVIEW OF MATERIALS SCIENCE. 1995; 25: 417-454 		0290125
407363 JOHNSON PD
SPIN-POLARIZED PHOTOEMISSION
ANNUAL REVIEW OF MATERIALS SCIENCE. 1995; 25: 455-485 		040123
408364 DRESSELHAUS MS, DRESSELHAUS G
FULLERENES AND FULLERENE-DERIVED SOLIDS AS ELECTRONIC MATERIALS
ANNUAL REVIEW OF MATERIALS SCIENCE. 1995; 25: 487-523 		0150159
409366 MELLOCH MR, WOODALL JM, HARMON ES, OTSUKA N, POLLAK FH, et al.
LOW-TEMPERATURE-GROWN III-V MATERIALS
ANNUAL REVIEW OF MATERIALS SCIENCE. 1995; 25: 547-600 		0770113
410367 SKROMME BJ
LUMINESCENCE AS A DIAGNOSTIC OF WIDE-GAP II-VI COMPOUND SEMICONDUCTOR-MATERIALS
ANNUAL REVIEW OF MATERIALS SCIENCE. 1995; 25: 601-646 		0100159
#Date / Author / JournalLCSGCSLCRCR
411369 ECKSTEIN JN, BOZOVIC I
HIGH-TEMPERATURE SUPERCONDUCTING MULTILAYERS AND HETEROSTRUCTURES GROWN BY ATOMIC LAYER-BY-LAYER MOLECULAR-BEAM EPITAXY
ANNUAL REVIEW OF MATERIALS SCIENCE. 1995; 25: 679-709 		050024
412370 KOLODZIEJSKI LA, GUNSHOR RL, NURMIKKO AV
WIDE-BANDGAP II-VI HETEROSTRUCTURES FOR BLUE-GREEN OPTICAL SOURCES - KEY MATERIALS ISSUES
ANNUAL REVIEW OF MATERIALS SCIENCE. 1995; 25: 711-753 		0120138
413371 Nowick AS
The Golden Age of crystal defects
ANNUAL REVIEW OF MATERIALS SCIENCE. 1996; 26: 1-19 		08042
414372 Kaufmann EN
Preface
ANNUAL REVIEW OF MATERIALS SCIENCE. 1996; 26: R5-R6 		0000
415373 Tirrell M
Polymer surfaces and interfaces
ANNUAL REVIEW OF MATERIALS SCIENCE. 1996; 26: R13-R14 		0000
416374 Rimai DS, DeMejo LP
Physical interactions affecting the adhesion of dry particles
ANNUAL REVIEW OF MATERIALS SCIENCE. 1996; 26: 21-41 		016055
417375 Tomozawa M
Fracture of glasses
ANNUAL REVIEW OF MATERIALS SCIENCE. 1996; 26: 43-74 		0240120
418376 Bieler TR, Mishra RS, Mukherjee AK
Superplasticity in hard-to-machine materials
ANNUAL REVIEW OF MATERIALS SCIENCE. 1996; 26: 75-106 		051118
419377 Binder K, Milchev A, Baschnagel J
Simulation studies on the dynamics of polymers at interfaces
ANNUAL REVIEW OF MATERIALS SCIENCE. 1996; 26: 107-134 		057191
420378 Suib SL
A review of open framework structures
ANNUAL REVIEW OF MATERIALS SCIENCE. 1996; 26: 135-151 		09044
#Date / Author / JournalLCSGCSLCRCR
421379 Sano M, Lvov Y, Kunitake T
Formation of ultrathin polymer layers on solid substrates by means of polymerization-induced epitaxy and alternate adsorption
ANNUAL REVIEW OF MATERIALS SCIENCE. 1996; 26: 153-187 		069069
422380 Bell LD, Kaiser WJ
Ballistic-electron-emission microscopy: A nanometer-scale probe of interfaces and carrier transport
ANNUAL REVIEW OF MATERIALS SCIENCE. 1996; 26: 189-222 		0640118
423381 Sumpter BG, Noid DW
On the design, analysis, and characterization of materials using computational neural networks
ANNUAL REVIEW OF MATERIALS SCIENCE. 1996; 26: 223-277 		0250360
424382 Halperin A, Williams DRM
Switching properties of liquid crystalline polymers at interfaces
ANNUAL REVIEW OF MATERIALS SCIENCE. 1996; 26: 279-298 		05045
425383 Clark DE, Sutton WH
Microwave processing of materials
ANNUAL REVIEW OF MATERIALS SCIENCE. 1996; 26: 299-331 		01941136
426384 Sullivan TD
Stress-induced voiding in microelectronic metallization: Void growth models and refinements
ANNUAL REVIEW OF MATERIALS SCIENCE. 1996; 26: 333-364 		014038
427385 Elbert DL, Hubbell JA
Surface treatments of polymers for biocompatibility
ANNUAL REVIEW OF MATERIALS SCIENCE. 1996; 26: 365-394 		01830125
428386 Weissman MB
Low-frequency noise as a tool to study disordered materials
ANNUAL REVIEW OF MATERIALS SCIENCE. 1996; 26: 395-429 		0301150
429388 Stuart MAC, Fleer GJ
Adsorbed polymer layers in nonequilibrium situations
ANNUAL REVIEW OF MATERIALS SCIENCE. 1996; 26: 463-500 		049070
430389 Fredrickson GH, Bates FS
Dynamics of block copolymers: Theory and experiment
ANNUAL REVIEW OF MATERIALS SCIENCE. 1996; 26: 501-550 		03460172
#Date / Author / JournalLCSGCSLCRCR
431390 Bergman L, Nemanich RJ
Raman spectroscopy for characterization of hard, wide-bandgap semiconductors: Diamond, GaN, GaAlN, AlN, BN
ANNUAL REVIEW OF MATERIALS SCIENCE. 1996; 26: 551-579 		022170
432391 Klein J
Shear, friction, and lubrication forces between polymer-bearing surfaces
ANNUAL REVIEW OF MATERIALS SCIENCE. 1996; 26: 581-612 		0162083
433392 delaRubia TD
Irradiation-induced defect production in elemental metals and semiconductors: A review of recent molecular dynamics studies
ANNUAL REVIEW OF MATERIALS SCIENCE. 1996; 26: 613-649 		0250100
434393 Hammer DA, Tirrell M
Biological adhesion at interfaces
ANNUAL REVIEW OF MATERIALS SCIENCE. 1996; 26: 651-691 		0480130
435394 Knapp GS, Beno MA, You H
Hard X-ray synchrotron radiation applications in materials science
ANNUAL REVIEW OF MATERIALS SCIENCE. 1996; 26: 693-725 		08040
436395 Dresselhaus MS
Future directions in carbon science
ANNUAL REVIEW OF MATERIALS SCIENCE. 1997; 27: 1-34 		0500100
437396 Summers CJ
Display materials
ANNUAL REVIEW OF MATERIALS SCIENCE. 1997; 27: R11-R12 		0000
438397 Fisk Z, Sarrao JL
The new generation high-temperature superconductors
ANNUAL REVIEW OF MATERIALS SCIENCE. 1997; 27: 35-67 		051136
439398 Greskovich C, Duclos S
Ceramic scintillators
ANNUAL REVIEW OF MATERIALS SCIENCE. 1997; 27: 69-88 		069030
440399 Solin SA
Clays and clay intercalation compounds: Properties and physical phenomena
ANNUAL REVIEW OF MATERIALS SCIENCE. 1997; 27: 89-115 		039181
#Date / Author / JournalLCSGCSLCRCR
441400 Yang DK, Huang XY, Zhu YM
Bistable cholesteric reflective displays: Materials and drive schemes
ANNUAL REVIEW OF MATERIALS SCIENCE. 1997; 27: 117-146 		015032
442401 Lewis JA
Binder removal from ceramics
ANNUAL REVIEW OF MATERIALS SCIENCE. 1997; 27: 147-173 		064081
443402 Magonov SN, Reneker DH
Characterization of polymer surfaces with atomic force microscopy
ANNUAL REVIEW OF MATERIALS SCIENCE. 1997; 27: 175-222 		0195067
444403 Wager JF, Keir PD
Electrical characterization of thin-film electroluminescent devices
ANNUAL REVIEW OF MATERIALS SCIENCE. 1997; 27: 223-248 		029029
445404 Chan HM
Layered ceramics: Processing and mechanical behavior
ANNUAL REVIEW OF MATERIALS SCIENCE. 1997; 27: 249-282 		0930114
446405 Ono YA
Materials for full-color electroluminescent displays
ANNUAL REVIEW OF MATERIALS SCIENCE. 1997; 27: 283-303 		010040
447406 Schadt M
Liquid crystal materials and liquid crystal displays
ANNUAL REVIEW OF MATERIALS SCIENCE. 1997; 27: 305-379 		0790117
448408 Tarumi K, Bremer M, Geelhaar T
Recent liquid crystal material development for active matrix displays
ANNUAL REVIEW OF MATERIALS SCIENCE. 1997; 27: 423-441 		025022
449409 Kelly JR
Ceramics in restorative and prosthetic dentistry
ANNUAL REVIEW OF MATERIALS SCIENCE. 1997; 27: 443-468 		01040143
450411 Faber KT
Ceramic composite interfaces: Properties and design
ANNUAL REVIEW OF MATERIALS SCIENCE. 1997; 27: 499-524 		027084
#Date / Author / JournalLCSGCSLCRCR
451412 Zhang ZY, Wu F, Lagally MG
An atomistic view of Si(001) homoepitaxy
ANNUAL REVIEW OF MATERIALS SCIENCE. 1997; 27: 525-553 		0140122
452413 Scheffer T, Nehring J
Supertwisted nematic (STN) liquid crystal displays
ANNUAL REVIEW OF MATERIALS SCIENCE. 1997; 27: 555-583 		013037
453415 Birkmire RW, Eser E
Polycrystalline thin film solar cells: Present status and future potential
ANNUAL REVIEW OF MATERIALS SCIENCE. 1997; 27: 625-653 		0118049
454416 Auciello O, Ramesh R
Metal oxides
ANNUAL REVIEW OF MATERIALS SCIENCE. 1998; 28: XI-XIII 		0000
455417 Kaufmann EN
Untitled - Preface
ANNUAL REVIEW OF MATERIALS SCIENCE. 1998; 28: V-VI 		0000
456418 Goodenough JB
Jahn-Teller phenomena in solids
ANNUAL REVIEW OF MATERIALS SCIENCE. 1998; 28: 1-27 		053099
457419 Sleight AW
Isotropic negative thermal expansion
ANNUAL REVIEW OF MATERIALS SCIENCE. 1998; 28: 29-43 		081045
458420 Sun JZ, Gupta A
Spin-dependent transport and low-field magnetoresistance in doped manganites
ANNUAL REVIEW OF MATERIALS SCIENCE. 1998; 28: 45-78 		024183
459421 Scott JF
High-dielectric constant thin films for dynamic random access memories (DRAM)
ANNUAL REVIEW OF MATERIALS SCIENCE. 1998; 28: 79-100 		01130143
460423 Nakamura S
InGaN-based laser diodes
ANNUAL REVIEW OF MATERIALS SCIENCE. 1998; 28: 125-152 		017047
#Date / Author / JournalLCSGCSLCRCR
461425 Haddara YM, Bravman JC
Transient diffusion of beryllium and silicon in gallium arsenide
ANNUAL REVIEW OF MATERIALS SCIENCE. 1998; 28: 185-214 		01185
462426 Gosele U, Tong QY
Semiconductor wafer bonding
ANNUAL REVIEW OF MATERIALS SCIENCE. 1998; 28: 215-241 		0520120
463429 Norton DP
Science and technology of high-temperature superconducting films
ANNUAL REVIEW OF MATERIALS SCIENCE. 1998; 28: 299-347 		0240174
464430 Parise JB, Weidner DJ, Chen J, Liebermann RC, Chen G
In situ studies of the properties of materials under high-pressure and temperature conditions using multi-anvil apparatus and synchrotron X-rays
ANNUAL REVIEW OF MATERIALS SCIENCE. 1998; 28: 349-374 		0190130
465431 Auciello O, Krauss AR, Im J, Schultz JA
Studies of multicomponent oxide films and layered heterostructure growth processes via in situ, time-of-flight ion scattering and direct recoil spectroscopy
ANNUAL REVIEW OF MATERIALS SCIENCE. 1998; 28: 375-396 		019051
466432 Dimos D, Mueller CH
Perovskite thin films for high-frequency capacitor applications
ANNUAL REVIEW OF MATERIALS SCIENCE. 1998; 28: 397-419 		070066
467433 MacManus-Driscoll JL
Recent developments in conductor processing of high irreversibility field superconductors
ANNUAL REVIEW OF MATERIALS SCIENCE. 1998; 28: 421-462 		0480136
468434 Aggarwal S, Ramesh R
Point defect chemistry of metal oxide heterostructures
ANNUAL REVIEW OF MATERIALS SCIENCE. 1998; 28: 463-499 		0381113
469436 Cheng SZD, Keller A
The role of metastable states in polymer phase transitions: Concepts, principles, and experimental observations
ANNUAL REVIEW OF MATERIALS SCIENCE. 1998; 28: 533-562 		056094
470438 Meador MA
Recent advances in the development of processable high-temperature polymers
ANNUAL REVIEW OF MATERIALS SCIENCE. 1998; 28: 599-630 		0450116
#Date / Author / JournalLCSGCSLCRCR
471439 Badding JV
High-pressure synthesis, characterization, and tuning of solid state materials
ANNUAL REVIEW OF MATERIALS SCIENCE. 1998; 28: 631-658 		0490105
472440 Flemings MC
What next for departments of materials science and engineering?
ANNUAL REVIEW OF MATERIALS SCIENCE. 1999; 29: 1-23 		08013
473442 Hartmann U
Magnetic force microscopy
ANNUAL REVIEW OF MATERIALS SCIENCE. 1999; 29: 53-87 		071020
474443 Nolas GS, Morelli DT, Tritt TM
Skutterudites: A phonon-glass-electron crystal approach to advanced thermoelectric energy conversion applications
ANNUAL REVIEW OF MATERIALS SCIENCE. 1999; 29: 89-116 		0188071
475444 Kirtley JR, Wikswo JP
Scanning squid microscopy
ANNUAL REVIEW OF MATERIALS SCIENCE. 1999; 29: 117-148 		042098
476446 Gao HJ, Nix WD
Surface roughening of heteroepitaxial thin films
ANNUAL REVIEW OF MATERIALS SCIENCE. 1999; 29: 173-209 		0109064
477447 Gruen DM
Nanocrystalline diamond films
ANNUAL REVIEW OF MATERIALS SCIENCE. 1999; 29: 211-259 		04300126
478448 Goodson KE, Ju YS
Heat conduction in novel electronic films
ANNUAL REVIEW OF MATERIALS SCIENCE. 1999; 29: 261-293 		0750109
479449 Suslick KS, Price GJ
Applications of ultrasound to materials chemistry
ANNUAL REVIEW OF MATERIALS SCIENCE. 1999; 29: 295-326 		03870143
480450 Van der Biest OO, Vandeperre LJ
Electrophoretic deposition of materials
ANNUAL REVIEW OF MATERIALS SCIENCE. 1999; 29: 327-352 		02110113
#Date / Author / JournalLCSGCSLCRCR
481451 Fujihira M
Kelvin probe force microscopy of molecular surfaces
ANNUAL REVIEW OF MATERIALS SCIENCE. 1999; 29: 353-380 		071190
482452 Moodera JS, Nassar J, Mathon G
Spin-tunneling in ferromagnetic junctions
ANNUAL REVIEW OF MATERIALS SCIENCE. 1999; 29: 381-432 		01580143
483453 Barbara PF, Adams DM, O'Connor DB
Characterization of organic thin film materials with near-field scanning optical microscopy (NSOM)
ANNUAL REVIEW OF MATERIALS SCIENCE. 1999; 29: 433-+ 		0420107
484454 Williams CC
Two-dimensional dopant profiling by scanning capacitance microscopy
ANNUAL REVIEW OF MATERIALS SCIENCE. 1999; 29: 471-504 		094050
485456 Rosenberg R, Murray CB
From materials to devices: Scaling and integration
ANNUAL REVIEW OF MATERIALS SCIENCE. 2000; 30: XII-XV 		0000
486457 Kaufmann EN, Editorial Comm
Preface
ANNUAL REVIEW OF MATERIALS SCIENCE. 2000; 30: V-VI 		0000
487458 Cohen ML
The theory of real materials
ANNUAL REVIEW OF MATERIALS SCIENCE. 2000; 30: 1-26 		021064
488459 Muratov VA, Fischer TE
Tribochemical polishing
ANNUAL REVIEW OF MATERIALS SCIENCE. 2000; 30: 27-51 		08188
489460 Yamanaka S
High-T-c superconductivity in electron-doped layer structured nitrides
ANNUAL REVIEW OF MATERIALS SCIENCE. 2000; 30: 53-82 		039095
490461 Bunning TJ, Natarajan LV, Tondiglia VP, Sutherland RL
Holographic polymer-dispersed liquid crystals (H-PDLCs)
ANNUAL REVIEW OF MATERIALS SCIENCE. 2000; 30: 83-115 		0234061
#Date / Author / JournalLCSGCSLCRCR
491462 Rogers JA, Maznev AA, Banet MJ, Nelson KA
Optical generation and characterization of acoustic waves in thin films: Fundamentals and applications
ANNUAL REVIEW OF MATERIALS SCIENCE. 2000; 30: 117-157 		076157
492463 Thompson CV
Structure evolution during processing of polycrystalline films
ANNUAL REVIEW OF MATERIALS SCIENCE. 2000; 30: 159-190 		01923108
493464 Gibson LJ
Mechanical behavior of metallic foams
ANNUAL REVIEW OF MATERIALS SCIENCE. 2000; 30: 191-227 		078074
494467 Sniegowski JJ, de Boer MP
IC-compatible polysilicon surface micromachining
ANNUAL REVIEW OF MATERIALS SCIENCE. 2000; 30: 299-333 		01000104
495468 Mooney PM, Chu JO
SiGe technology: Heteroepitaxy and high-speed microelectronics
ANNUAL REVIEW OF MATERIALS SCIENCE. 2000; 30: 335-362 		036185
496469 Kaloyeros AE, Eisenbraun E
Ultrathin diffusion barriers/liners for gigascale copper metallization
ANNUAL REVIEW OF MATERIALS SCIENCE. 2000; 30: 363-385 		0149086
497470 Gschneidner KA, Pecharsky VK
Magnetocaloric materials
ANNUAL REVIEW OF MATERIALS SCIENCE. 2000; 30: 387-429 		01970143
498472 Kimura T, Tokura Y
Layered magnetic manganites
ANNUAL REVIEW OF MATERIALS SCIENCE. 2000; 30: 451-474 		083063
499473 Efros AL, Rosen M
The electronic structure of semiconductor nanocrystals
ANNUAL REVIEW OF MATERIALS SCIENCE. 2000; 30: 475-521 		0264064
500474 Harper JME, Cabral C, Lavoie C
Mechanisms for enhanced formation of the C54 phase of titanium silicide ultra-large-scale integration contacts
ANNUAL REVIEW OF MATERIALS SCIENCE. 2000; 30: 523-543 		023052
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